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จากการวิเคราะห์ด้วยกล้องจุลทรรศน์อิ

จากการวิเคราะห์ด้วยกล้องจุลทรรศน์อิเล็กตรอนแบบส่องกวาด (SEM) ที่กำลังขยาย 300 เท่า บริเวณขอบตัด (Cutting edge)

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Electron microscopic analysis of the songkwat (SEM) expanding only 300 edge cutting (Cutting edge)
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Results (English) 2:[Copy]

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The analysis of the scanning electron microscope scanning (SEM) at 300 times magnification of the edge cut (Cutting edge).

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Results (English) 3:[Copy]

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From the analysis of transmission electron microscope sweep (SEM) expanding 300 as the ขอบตัด (Cutting edge)

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