Although often discussed, there is limited information on the application of a Monitored Withstand
program. There are a number of “accidental” Monitored Withstand tests on which to draw anecdotal
information. For example, PD tests at elevated voltage for significant times will include a withstand
element resulting from the elevated voltage. However, in the course of the CDFI project, a number
of similar programs have begun and data from these tests were provided to the CDFI.