2.7. Scanning Electron Microscopy (SEM). A scanning electron microscop translation - 2.7. Scanning Electron Microscopy (SEM). A scanning electron microscop Thai how to say

2.7. Scanning Electron Microscopy (

2.7. Scanning Electron Microscopy (SEM). A scanning electron microscope (JSM-6510LV, JEOL, Japan) was used to obtain the characteristics of the adaxial and abaxial surfaces
of L. lucidum before and after a rainfall event (31.9 mm). Three leaves before and after rainfall event were selected, respectively. For each leaf, approximately 2 × 0.5 cm2 was
cut with a razor blade from the middle part of the leaf discarding the mid vein. Next, these samples were mounted on aluminum stubs with double-sided adhesive tape, with adaxial and abaxial surfaces exposed side by side on the same stub.Then the specimens were examined and photographed
under an accelerating voltage of 10 kV, a working distance of 10–13mm, and magnifications of 500x, 1000x, and 2000x. For each magnification, each leaf, and each leaf side, five
randomly chosen fields were observed. A multiscale analysis at magnifications of 500x, 1000x, and 2000x was carried out to cover different fields of view in order to see the large to
small particles on the leaf surface in the SEM [21]. From the 500x dimension of the initial field of view we zoomed in to 1000x and then 2000x. The 500x image (260
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2.7. Scanning Electron Microscopy (SEM). A scanning electron microscope (JSM-6510LV, JEOL, Japan) was used to obtain the characteristics of the adaxial and abaxial surfacesof L. lucidum before and after a rainfall event (31.9 mm). Three leaves before and after rainfall event were selected, respectively. For each leaf, approximately 2 × 0.5 cm2 wascut with a razor blade from the middle part of the leaf discarding the mid vein. Next, these samples were mounted on aluminum stubs with double-sided adhesive tape, with adaxial and abaxial surfaces exposed side by side on the same stub.Then the specimens were examined and photographedunder an accelerating voltage of 10 kV, a working distance of 10–13mm, and magnifications of 500x, 1000x, and 2000x. For each magnification, each leaf, and each leaf side, fiverandomly chosen fields were observed. A multiscale analysis at magnifications of 500x, 1000x, and 2000x was carried out to cover different fields of view in order to see the large tosmall particles on the leaf surface in the SEM [21]. From the 500x dimension of the initial field of view we zoomed in to 1000x and then 2000x. The 500x image (260
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